2010 г., Выпуск 4

V.N. Ustyuzhaninov

THE SYSTEM ANALYSIS AND CALCULATION OF RADIATION RESISTANCE OF POWER SEMICONDUCTOR SWITCHES WITH USE OF THE MATHEMATICAL LOGIC DEVICE

A way of the formal-logical description of action the semi-conductor structures of power devices in radiation exposure fields with use of the mathematical logic device is considered. The receipt method of estimated values of radiation resistance data for power switches is offered.
Keywords: power switches, radiation resistance, resistance system analysis.

V.N. Ustyuzhaninov

REGULARITIES OF SINGLE ERRORS SHAPING IN TYPICAL FRAGMENTS OF DIGITAL STRUCTURES UNDER INFLUENCE OF THE HEAVY CHARGED PARTICLES

Conditions of occurrence of logic errors and failures in typical fragments of regular digital structures under influence of the space heavy charged particles are considered. Classification and probabilistic estimates of errors is resulted, circuit methods of hardening on single errors are analyzed.
Keywords: single errors, heavy charged particles, resistance, digital equipment.

M.S. Boldyrev, V.V. Rudenko

RESEARCH OF DEPENDENCE OF THE ELECTROMAGNETIC FIELD AMPLITUDES BY AN IONIZING RADIATION INFLUENCE FROM THE GEOMETRICAL SIZES OF OBJECT

The analytical method of the Maxwell equations calculation is developed for electromagnetic fields in the closed cylinder by going through it axis symmetric current impulse created by an ionizing radiation stream, taking into account a density current distribution on cylinder radius. The dependence a field amplitude from the object size is researched.
Keywords: ionizing radiation, electromagnetic field, calculation method.

O.V. Baranova, I.B. Yashanin, O.M. Vinogradova, P.V. Kopnov

STATISTICAL PROCESSING AND ANALYSIS OF RESULTS OF MICROCIRCUIT RADIATION RESEARCHES BY MEANS OF THE AUTOMATED INFORMATION DATA SYSTEM

Capability of statistical processing and analysis of results of microcircuit radiation researches under  influence of an ionizing radiation by means of automated information system in production process radiation-resistant LSI and VLSI are shown.
Keywords: microcircuits, ionizing radiation, automated information system.

A.V. Kurganov, L.V. Romanenko, V.K. Seleznev

EXPERIMENTAL RESEARCHES OF THE PULSE ELECTRIC STRENGTH OF STABILITRONS

Results of experimental researches of pulse electric strength of stabilitrons by influence of electric pulses of different duration and repetition frequency are described.
Keywords: stabilitrons, pulse electric strength.

V.S. Anashin, A.V. Lebedev, V.D. Popov, A.V. Skorodumova, P.A. Chubunov, I.I. Shagurin

RESISTANCE DEFINITION TO THE SPACE IONIZING RADIATIONS REGARDING DOSE EFFECTS OF MICROCONTROLLERS LPC 2114 WITH RADIATION-THERMAL PROCESSING USE

Results of nondestructive definition of the cumulative dose limit of 32-bit microcontrollers LPC 2114 with light-dose low-intensity exposure use with following low-temperature annealing are described.
Keywords: radiation-thermal processing, dose resistance, safe dose, low-temperature annealing, low-intensity light-dose exposure.

I.V. Getselev, V.I. Tulupov, B.Y. Shcherbovsky

THE UNIVERSAL TELESCOPE INTENDED FOR REGISTRATION OF PARTICLES ON BOARD THE SPACECRAFT

The work principle of telescope containing 6 detectors switched on coincidence and anticoincidence is in detail described. The telescope is intended for registration of proton, alpha particle and electron streams in a wide energy range.
Keywords: telescope, spacecraft.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov

ESTIMATION OF INFLUENCE OF «SLUMP» SUPPLY ON EXCITATION LEVEL OF CMOS IC LATCH-UP BY PULSE IONIZING RADIATION

The influence of «slump» supply on excitation level of CMOS IC latch-up by pulse ionizing radiation is experimentally investigated. «Slump» supply was simulated by loss in voltage on IC supply circuit resistance from ionization current of diode 2Д213А, paralleled a microcircuit. It is shown, what even deep «slump» (with loss in voltage on IC to zero) does not inhibit latch-up and leads only to some increase of level of its excitation.
Keywords: latch-up, microcircuit, «slump» supply, pulse ionizing radiation.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov

ESTIMATION OF INFLUENCE OF THE SUPPLY DELAY ON EXCITATION LEVEL OF CMOS IC LATCH-UP BY PULSE IONIZING RADIATION

The influence of the supply delay of microcircuits concerning a pulse ionizing radiation on excitation level of CMOS IC latch-up is estimated. It is shown that the supply delay does not inhibit and leads only to some increase of levels of its excitation. The estimation of dependence of latch-up excitation levels from delay time is received.
Keywords: latch-up, microcircuits, supply delay, pulse ionizing radiation.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov, A.S. Artamonov, G.G. Davydov, L.N. Kessarinsky, S.P. Puhov, S.L. Eliash

EXPERIENCE OF THE EXPERIMENTAL ESTIMATION OF RELATIVE EFFICIENCY OF THE PULSE PHOTON RADIATIONS OF INSTALLATIONS ARSA AND RIUS-5 FOR VARIOUS TYPES OF ELECTRONICS PRODUCTS

Experimental estimation of relative efficiency of photon radiation of installations ARSA and RIUS-5 by comparison tests of diodes 2Д522, 2Д103А, p-i-n-diode "Bed", microcircuits 5584ТМ9Т and 1485ХК4Т are resulted.
Keywords: photon radiation, integrated response, dosimetry, electronics products.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov, D.A. Aleshechkin, N.S. Bolnyh

RESEARCH OF INFLUENCE OF TESTED PROTOTYPE ELECTRONICS EQUIPMENT ON EFFICIENCY OF PHOTON RADIATION OF INSTALLATION RIUS-5

The influence of tested blocks of communications electronics equipment on efficiency of photon radiation of installation RIUS-5 for the electronics products tested simultaneously with samples of equipment and other products is experimental estimated. The received results are to be used at improvement of dosimetric support of tests.
Keywords: photon radiation, integrated response, dosimetry.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov, D.A. Aleshechkin, N.S. Bolnyh

ESTIMATION OF EFFICIENCY DEPENDENCE OF PHOTON RADIATION OF INSTALLATION RIUS-5 ON RELATIVE POSITION OF THE TESTED SAMPLE AND THE SUPPORT DETECTOR

It is shown that efficiency of photon radiation of simulators of type RIUS-5 can essentially depend on relative position of the support detector IC-7 and tested product. The received results are to be used by improvement of test dosimetric supports, and also by verification of calculation methods of estimation of relative efficiency of pulse photon radiation of installations.
Keywords: photon radiation, support detector, dosimetry, installation RIUS-5.

V.S. Figurov

CORRELATION BETWEEN MINIMUM LEVELS OF FAILURE-FREE WORK OF ELECTRONICS PRODUCTS BY PULSE IONIZING RADIATION IN DOSE UNITS AND DOSE RATE

The correlation between minimum levels of failure-free work of electronics products by pulse ionizing radiation in dose units (min D_бр(j) or D_бр(0)) and dose rate (min P_бр(j) or P_бр(¥))at all possible pulse forms is established. For threshold failures relation D_бр(0) to P_бр(¥) is equal to effective relaxation time for failure development process of the given type (latch-up, functional failures etc.).
Keywords: threshold failure, effective relaxation time, pulse ionizing radiation.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov, A.P. Metelev, A.A. Fedorov

EXPERIMENTAL ESTIMATION OF THE RELATIVE EFFICIENCY OF PHOTON RADIATION OF INSTALLATIONS UIN-10 AND RIUS-5

By results of integrated responses definition of diode HFA08TB60 and p-i-n-diode "Bed" on reverse current on impulses of installations UIN-10 and RIUS-5 is estimated relative efficiency of photon radiation of these installations. The received estimations characterize relative radiation ionizing power of investigated installations and do not depend on the their pulse form.
Keywords: photon radiation, integrated response, installations UIN-10, RIUS-5.

V.S. Figurov, V.V. Baikov, V.V. Shelkovnikov, A.S. Artamonov, A.S. Pyhtina

METHODS OF DOSIMETRIC SUPPORT OF ELECTRONICS PRODUCTS RESISTANCE TESTS TO THE PULSE IONIZING RADIATION OF INSTALLATION ARSA

On the basis of experience of electronics product tests on high-performance installation ARSA are considered different methods of dosimetric support of tests on this installation. Optimum is the method of radiation dose monitoring of tested product under the integrated response of the small outside diode to radiation pulse of installation.
Keywords: installation ARSA, electronics products, dosimetry, monitoring.

V.F. Zinchenko, K.V. Lavrentev, A.K. Lipsky, V.N. Ulimov, R.G. Useinov, N.N. Alekseev, N.N. Bulgakov

RESEARCH OF USE POSSIBILITIES OF ACCELERATING COMPLEX TVS ITEP FOR IRREVERSIBLE FAILURESSIMULATION IN ELECTRONICS PRODUCTS BY SPACE SEPARATE CHARGED PARTICLES TREATMENT

The basic problems and suggested approaches to their decision are considered by resistance tests of electronics products to single event effects by space heavy charged particles and high-energy protons treatment with use of an accelerating complex TVS ITEP.
Keywords: electronics products, single events, latch-up.

Yu.P. Bakulin, V.P. Baranov, E.N. Danilovich, S.N. Yashin

TO THE QUESTION ON MEASUREMENT OF HIGH-INTENSITY PHOTON RADIATION WITH THE HELP THERMOLUMINESCENT DETECTORS

Research results of metrological characteristics of thermoluminescent detectors (TLD) on the basis of lithium fluoride (DTG-4), aluminophosphate glass (PGT), aluminium oxide (TLD-500 K), applied to measurements of pulse photon radiation of accelerators RIUS-5, UIN-10, LIU-10 are presented. Preliminary results of researches of detectors TLD-800 (Li2B4O7:Mn)) are described.
Keywords: detector, photon radiation, research.

N.K. Abrosimov, A.S. Vorobiev, E.M. Ivanov, G.F. Miheev, G.A. Ryabov, M.G. Tverskoy, O.A. Shcherbakov

ACCELERATING COMPLEX PNPI: POSSIBILITIES FOR RADIATION TEST OF ELECTRONIC COMPONENT BASE

Data about created on synchrocyclotrone PNPI RAS possibilities for radiation test of electronic component base on proton and neutron beams according to the international standards are resulted.
Keywords: synchrocyclotrone, radiation test, electronic component base.

V.Yu. Kononenko, A.I. Kormilitsyn, R.R. Hafizov, R.V. Protas, D.E. Pavlovskih, I.V. Zuev

MODE OF INTEGRATED EFFECT OF ELECTROMAGNETIC + GAMMA RADIATION ON ACCELERATOR EMIR-2

Research results of operating conditions of the accelerator with bremsstrahlung and electromagnetic pulse generation synchronized on the signal time with error ± 100 nanoseconds are described.
Keywords: accelerator EMIR-2, electromagnetic impulse, bremsstrahlung radiation.